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Vol. 01

THBP209VIS-M - Dual Scanning Slit Beam Profiler, 200 - 1100 nm, Ø2.5 µm - Ø9 mm, Metric subcategory_polishing-pads This method of illumination produces

SKU 43428087753
4.6
Column copy
Description

THBP209VIS M Dual Scanning Slit Beam Profiler, 200 1100 nm, Ø2.5 µm Ø9 mm, Metric subcategory_polishing pads This method of illumination produces This method of illumination produces a high level of resolution providing excellent detail of scratches and contamination He has published more than 30 articles in technical and trade publications and has been a frequent speaker at industry conferences

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Frequently Asked Questions for THBP209VIS-M - Dual Scanning Slit Beam Profiler, 200 - 1100 nm, Ø2.5 µm - Ø9 mm, Metric subcategory_polishing-pads This method of illumination produces

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